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Step Height Measurement
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No.
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92
Zeiss Axiovert MAT 40 Inverted Microscope
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91
Veeco/DI Dimension 7000 Atomic Force Microscope (AFM)
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90
Veeco/DI Dimension 3100 Atomic Force Microscope (AFM)
ÆÇ¸ÅÁß
89
VEECO Detak V200-SL Surface Profiler
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88
TMS 2000 Texture Measurement System
ÆÇ¸ÅÁß
87
Tencor P-17 stylus surface profiler
ÆÇ¸ÅÁß
86
Tencor P-16+ stylus surface profiler
ÆÇ¸ÅÁß
85
Tencor P-16+ stylus surface profiler
ÆÇ¸ÅÁß
84
Tencor / Prometrix RS 55 4PP
ÆÇ¸ÅÁß
83
SSM 530 HG-CV System for EPI resistivity measurement
ÆÇ¸ÅÁß
82
SSM 5130 HG-CV System for EPI resistivity measurement
ÆÇ¸ÅÁß
81
SSM 495 HG-CV System for EPI resistivity measurement
ÆÇ¸ÅÁß
80
SSM 495 HG-CV System for EPI resistivity measurement
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79
SSM 2000 NANOSRP
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78
SSM 2000
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77
Semilab WT-2020( ¥ì-PCR) Carrier life time measurement
ÆÇ¸ÅÁß
76
Semilab WT-2000PVN( ¥ì-PCD) Carrier life time measurement
ÆÇ¸ÅÁß
75
SDI/SEMILAB FAaST 230 Non-contact CV/IV Measurement System
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74
Olympus MX61L-F 300mm Microscope
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73
Olympus MX61F microscope & AL110-LMB86 autoloader
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72
Olympus BH2-UMA Microscope
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71
Nikon Eclips L200 + NWL641 (Scope & Autoloader)
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70
Nanometrics Nanospec 6100
ÆÇ¸ÅÁß
69
Nanometrics Nanospec 2100 Thin Film Thickness measurement
ÆÇ¸ÅÁß
68
Nanometrics Nanospec 210 Thin Film Thickness measurement
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67
N&K OptiPrime - CD
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66
N&K 5300 CD Trench Depth & Thin film thickness Measurement
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65
N&K 5000 CD Trench Depth & Thin film thickness Measurement
ÆÇ¸ÅÁß
64
N&K 3000 Trench Depth & Thin film thickness Measurement
ÆÇ¸ÅÁß
63
Microsense 6033T Wafer Thickness Measurement
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62
MCV 2500 HG-CV System for EPI resistivity measurement
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61
Leica DM IRM Inverted Research Microscope for Material Testing
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60
KLA-Tencor Surfscan 6220 (SFS6220)particle counter
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59
KLA-Tencor Surfscan 6200 particle counter
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58
KLA-Tencor OSA 6100 Optical Defect Inspection
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57
KLA-Tencor OSA 6100 Optical Defect Inspection
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56
KLA-Tencor Candela CS20 Optical Defect Inspection
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55
KLA-Tencor Candela CS20 Optical Defect Inspection
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54
KLA-Tencor Candela CS10V Optical Defect Inspection
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53
KLA-Tencor Candela 8620 Optical Defect Inspection
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52
KLA-Tencor Candela 8620 Optical Defect Inspection
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51
KLA-Tencor Candela 8600 Optical Defect Inspection
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50
KLA-Tencor Candela 8600 Optical Defect Inspection
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49
KLA Tencor Candela CS920
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48
KLA Tencor AIT XP+ (Fusion)
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47
BIO-RAD QS-300 with Pike MAP300 (for EPI / CO)
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46
Bio-Rad QS-300 FT-IR (EPI, BPSG)
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45
Bio-Rad QS-300 FT-IR (EPI.BPSG,C.O)
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44
BIORAD QS-1200A with PikeMap (for EPI / BPSG / CO)
ÆÇ¸ÅÁß
43
*(sold)KLA-Tencor Candela CS20 Optical Defect Inspection
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[1]
[2]
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31208 TEL: 041-554-6920~1 FAX: 041-554-6922